Cable Diagnostics VLF and Tan Delta Specialists is a Sister Company of HVDSA.com

Cable Diagnostics is Part of HVDSA.com

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Phone
+ 27 (11) 782 0875 (SA)
Faximile
+ 27 (11) 782 0163 (SA)
Email
sales@cablediagnostics.com

 HVA 30 - High Voltage VLF and DC Hipot Test Instrument

The single piece HVA30 is not only the most advanced high voltage VLF (Very Low Frequency) test system available; it is also the lightest, most compact instrument of its type on the market.

The instrument offers fully automatic Testing Sequences which allow the operator to effortlessly apply the correct testing standards without having to remember what those testing parameters are, thus avoiding possible over stressing of the cable system.
Standard features like built in storage of test results, smooth load independent and symmetrical Sinewave HV outputs, DC and AC VLF outputs, capacitance and insulation resistance (mega-ohmmeter) measurements, accurate RMS metering, integrated discharge and transient protection, all make this instrument the most sophisticated and easiest to use VLF instrument available.
FEATURES:

Smallest, lightest, most advanced universal high voltage test

instrument available.

VLF (0.1Hz), DC (+/-), Cable Fault Conditioning (Burning), and

Sheath/Jacket Testing modes all included.

Fully Automatic or manual cable test sequences

True Symmetrical Sinusoidal, load independent, output waveform

across the full load range.

Real-time display of actual output waveform

Easy to use, ergonomic, menu guided, large backlit user interface

Rugged, one-piece design for easy portability

Large output load capability (up to 5uF)

Automatic and integrated load capacitance measurement with

optimum frequency selection.

Integrated memory for storage of test results that can be 

downloaded to a PC/laptop at a later time.

No oil or arcing contacts that require routine maintenance

Short circuited protected with active arc management regulation 
that avoids the usual nuisance tripping of conventional HV test 
equipment when a dielectric failure occurs

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